Jia Q.X., Wang H., MacManus-Driscoll J.L., Civale L., Maiorov B., Holesinger T., Foltyn S., Hengstberger F., Durrell J., Harrington S., Kurumovic A., Wimbush S., Lia M.C., Vickers M.E., Dunlop L., Weber H., Rikel V.M.
Ключевые слова: HTS, YBCO, films epitaxial, LPE process, grain alignment, microstructure, fabrication
Ключевые слова: HTS, YBCO, films thick, films epitaxial, LPE process, texture, grain alignment, fabrication, nucleation
Sohma M., Yamaguchi I., Tsukada K., Kumagai T., Koyanagi K., Manabe T., Tsuchiya T., Ebisawa T., Ohtsu H.
Carrasco M.F., Costa F.M.(flor@fis.ua.pt), Silva R.F., Amaral V.S., Vieira J.M.
Ключевые слова: HTS, YBCO, coated conductors multifilamentary, substrate Cu, texture, grain alignment, surface, nanoscaled roughness, strain effects, stress effects, fabrication
Meslin S., Harnois C., Chateigner D., Henrist C., Cloots R., Grossin D.(david@grossin.com), Mathieu J., Noudem J.-G.
Ключевые слова: HTS, YBCO, bulk, fabrication, perforated sample structure, grain alignment, texture, measurement technique
Teranishi R.(teranishi@istec.or.jp), Shiohara T.I.
Ключевые слова: HTS, coated conductors, review, Jc/B curves, YBCO, IBAD process, PLD process, Bi2223/Ag, Nb3Sn, economic analysis, grain alignment, long conductors, critical caracteristics, fabrication
Ключевые слова: HTS, YBCO, coated conductors, MOD process, multilayered structures, grain alignment, critical current, thickness dependence, doping effect, pinning, defects, critical current density, angular dependence, microstructure, grain structure, Jc/B curves, grain boundaries, plans, operational performance, presentation, fabrication, review, critical caracteristics
Iijima Y., Muroga T., Saitoh T., Izumi T., Shiohara Y., Watanabe T., Kakimoto K., Yamada Y., Iwai H., Hirayama T., Sutoh Y., Miyata S., Sasaki H., Kato T.(tkato@jfcc.or.jp), Ikuhara Y., Ibi A., Sasaki Y.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, PLD process, fabrication, microstructure, grain alignment
Ueda S., Horii S., Kishio K., Shimoyama J., Miyahara Y.(tt46749@mail.ecc.u-tokyo.ac.jp.)
Ключевые слова: HTS, films, MOD process, substrate single crystal, substrate SrTiO3, grain alignment, microstructure, fabrication
Nakamura T., Takahashi K., Awaji S., Watanabe K., Kiss T., Inoue M., Yamada Y., Ibi A., Shiohara Y.Y., Mitsui D., Fujiwara T.N.
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